VLSI Test and Testability (Syllabus)

 VLSI Test and Testability

Course Code: 6TMVD-203

COURSE OBJECTIVE:

The objective of this course is to provide students with a sound knowledge of VLSI systems covering the following:

  • Processor architectures, memory organization and performance analysis, and concepts and techniques for parallel processing and pipeline processing.
  • High-speed synchronization design and system noise consideration.

 

Syllabus:

UNIT – I Introduction to Testing Process: CMOS Testing, Reliability, Failures & Faults, Levels of Testing, Test economics, Elementary Testing Concepts, System and Field Testing, Burn in boards.

UNIT - II   Logic Simulation & Fault modelling: Delay Models, Event driven simulation, general fault emulation, fault detection and redundancy, fault equivalence and fault dominance. Stuck-at faults, bridging faults, transistor faults, delay faults etc. Fault detection using Boolean Difference, Path Sensitization. Fault Collapsing.

UNIT - III Test generation for combinational & sequential circuits: D-algorithm, PODEM, SPOOF. Automatic Test Pattern Generation. Primitive and Propagation Cubes. Fan-out Oriented Test Generation. Controllability and Observe ability. Testing of sequential circuits as iterative combinational circuits, state table verification, random testing.

UNIT - IV  Design for testability: Ad-hoc methods, Full scan & Partial scan design. Boundary scans. Testability analysis.

UNIT -V    Built-in self-test & IDDQ testing: RAM BIST, Logic BIST Random and weighted random pattern testability BIST Pattern generator and response analyzer Scan-based BIST architecture Test point insertion for improving random testability. IDDQ testing, IDDQ test patterns, IDDQ measurement Case studies, Design for IDDQ testability.

COURSE OUTCOME:

After the completion of this course, the students are able to:

  • ·         Acquire knowledge about fault modeling and collapsing.
  • ·         Learn about various combinational atpg.
  • ·         Understand sequential test pattern generation.
  • ·         Use various verification techniques.

Reference Books:

  • ·         Fault Tolerant and Fault Testable Hardware Design Parag K. Lala     BS Publication
  • ·         Principles of CMOS VLSI design N. Weste and K. Eshraghian Addison-Wesle

Book And Notes plz download the Book Link:- Parag K. Lala Book

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